●System Overview
●The C8051F06x family of devices are fully integrated mixed-signal System-on-a-Chip MCUs with 59 digital I/O pins (C8051F060/2/4/6) or 24 digital I/O pins (C8051F061/3/5/7), and two integrated 16-bit 1 Msps ADCs. Highlighted features are listed below; refer to Table 1.1 for specific product feature selection.
●• High-Speed pipelined 8051-compatible CIP-51 microcontroller core (up to 25 MIPS)
●• Two 16-bit 1 Msps ADCs with a Direct Memory Access controller
●• Controller Area Network (CAN 2.0B) Controller with 32 message objects, each with its own indentifier mask (C8051F060/1/2/3)
●• In-system, full-speed, non-intrusive debug interface on-chip
●• 10-bit 200 ksps ADC with PGA and 8-channel analog multiplexer (C8051F060/1/2/3)
●• Two 12-bit DACs with programmable update scheduling (C8051F060/1/2/3)
●• 64 kB (C8051F060/1/2/3/4/5) or 32 kB (C8051F066/7) of in-system programmable Flash memory
●• 4352 (4096 + 256) bytes of on-chip RAM
●• External Data Memory Interface with 64 kB direct address space (C8051F060/2/4/6)
●• SPI, SMBus/I2C, and (2) UART serial interfaces implemented in hardware
●• Five general purpose 16-bit Timers
●• Programmable Counter/Timer Array with six capture/compare modules
●• On-chip Watchdog Timer, VDD Monitor, and Temperature Sensor
●Analog Peripherals
●\- Two 16-Bit SAR ADCs
● • 16-bit resolution
● • ±0.75 LSB INL, guaranteed no missing codes
● • Programmable throughput up to 1 Msps
● • Operate as two single-ended or one differential con verter
● • Direct memory access; data stored in RAM without software overhead
● • Data-dependent windowed interrupt generator
●\- 10-bit SAR ADC (C8051F060/1/2/3)
● • Programmable throughput up to 200 ksps
● • 8 external inputs, single-ended or differential
● • Built-in temperature sensor
●\- Two 12-bit DACs (C8051F060/1/2/3)
● • Can synchronize outputs to timers for jitter-free wave form generation
●\- Three Analog Comparators
● • Programmable hysteresis/response time
●\- Voltage Reference
●\- Precision VDD Monitor/Brown-Out Detector
●On-Chip JTAG Debug & Boundary Scan
●\- On-chip debug circuitry facilitates full-speed, nonintrusive in-circuit/in-system debugging
●\- Provides breakpoints, single-stepping, watchpoints, stack monitor; inspect/modify memory and registers
●\- Superior performance to emulation systems using ICE-chips, target pods, and sockets
●\- IEEE1149.1 compliant boundary scan
●\- Complete development kit
●High Speed 8051 µC Core
●\- Pipelined instruction architecture; executes 70% of instruction set in 1 or 2 system clocks
●\- Up to 25 MIPS throughput with 25 MHz clock
●\- Flexible Interrupt sources
●Memory
●\- 4352 Bytes internal data RAM (4 k + 256)
●\- 64 kB (C8051F060/1/2/3/4/5), 32 kB (C8051F066/7) Flash; In-system programmable in 512-byte sectors
●\- External 64 kB data memory interface with multiplexed and non-multiplexed modes (C8051F060/2/4/6)
●Digital Peripherals
●\- 59 general purpose I/O pins (C8051F060/2/4/6)
●\- 24 general purpose I/O pins (C8051F061/3/5/7)
●\- Bosch Controller Area Network (CAN 2.0B - C8051F060/1/2/3)
●\- Hardware SMBus™ (I2C™ Compatible), SPI™, and two UART serial ports available concurrently
●\- Programmable 16-bit counter/timer array with 6 capture/compare modules
●\- 5 general purpose 16-bit counter/timers
●\- Dedicated watchdog timer; bi-directional reset pin
●Clock Sources
●\- Internal calibrated precision oscillator: 24.5 MHz
●\- External oscillator: Crystal, RC, C, or clock
● Supply Voltage .......................... 2.7 to 3.6 V
●\- Multiple power saving sleep and shutdown modes
●100-Pin and 64-Pin TQFP Packages Available Temperature Range: -40 to +85 °C
